Thomas Basler

Publication Activity (10 Years)

Years Active: 2012-2023
Publications (10 Years): 4

Top Topics

Computational Efficiency

Semiconductor Devices

Top Venues

IET Circuits Devices Syst.

Microelectron. Reliab.

Publications

Christian Schwabe, Xing Liu, Tobias N. Wassermann, Paul Salmen, Thomas Basler
SiC MOSFET threshold voltage stability during power cycling testing and the impact on the result interpretation. IRPS (2023)
Shanmuganathan Palanisamy, Thomas Basler, Josef Lutz, Cesare Künzel, Larissa Wehrhahn-Kilian, Rudolf Elpelt
Investigation of the bipolar degradation of SiC MOSFET body diodes and the influence of current density. IRPS (2021)
Shanmuganathan Palanisamy, Josef Lutz, R. Boldyrjew-Mast, Thomas Basler
Thermomechanical behaviour of inverse diode in SiC MOSFETs under surge current stress. IRPS (2020)
Susanne Fichtner, Sophia Frankeser, Josef Lutz, R. Rupp, Thomas Basler, R. Gerlach
Ruggedness of 1200 V SiC MPS diodes. Microelectron. Reliab. 55 (9-10) (2015)
Thomas Basler, M. Pfaffenlehner, Hans Peter Felsl, Franz-Josef Niedernostheide, F. Pfirsch, Hans-Joachim Schulze, Roman Baburske, Josef Lutz
Switching ruggedness and surge-current capability of diodes using the self-adjusting p emitter efficiency diode concept. IET Circuits Devices Syst. 8 (3) (2014)
Thomas Basler, Josef Lutz, Roland Jakob, Thomas Bruckner
Surge current capability of IGBTs. SSD (2012)
Tilo Poller, Thomas Basler, Magnar Hernes, Salvatore D'Arco, Josef Lutz
Mechanical analysis of press-pack IGBTs. Microelectron. Reliab. 52 (9-10) (2012)