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Thermomechanical behaviour of inverse diode in SiC MOSFETs under surge current stress.

Shanmuganathan PalanisamyJosef LutzR. Boldyrjew-MastThomas Basler
Published in: IRPS (2020)
Keyphrases
  • computer simulation
  • low voltage
  • real time
  • database systems
  • artificial neural networks