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Reliability of power electronic devices against cosmic radiation-induced failure.
Gerald Sölkner
Winfried Kaindl
Hans-Joachim Schulze
Gerhard K. M. Wachutka
Published in:
Microelectron. Reliab. (2004)
Keyphrases
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electronic devices
failure rate
highly reliable
power consumption
smart phones
power distribution systems
x ray
infrared
mobile devices
information retrieval
real time
mobile phone
database
case study
computer vision
learning algorithm
failure prediction