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Analysis of high-power devices using proton beam induced charge microscopy.

M. ZmeckJ. C. H. PhangAndrew BettiolT. OsipowiczF. WattL. J. BalkFranz-Josef NiedernostheideHans-Joachim SchulzeE. FalckR. Barthelmess
Published in: Microelectron. Reliab. (2001)
Keyphrases
  • high power
  • image analysis
  • real time
  • genetic algorithm
  • high resolution
  • image compression
  • low power
  • power supply