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Ruggedness analysis of 3.3 kV high voltage diodes considering various buffer structures and edge terminations.

Birk HeinzeJosef LutzHans Peter FelslHans-Joachim Schulze
Published in: Microelectron. J. (2008)
Keyphrases
  • high voltage
  • neural network
  • data mining
  • fuzzy logic
  • data sets
  • machine learning
  • genetic algorithm
  • support vector machine
  • multi class
  • semi supervised