H. Yamashita

Publication Activity (10 Years)

Years Active: 2010-2023
Publications (10 Years): 3

Top Topics

Surgical Navigation

Top Venues

VLSI Technology and Circuits

Comput. Medical Imaging Graph.

Publications

N. Ishihara, Y. Shimada, T. Ochi, S. Seto, H. Matsuo, H. Yamashita, S. Morita, M. Ukishima, K. Uejima, Y. Arayashiki, S. Kajiwara, A. Murayama, K. Nishiyama, K. Sugimae, S. Mori, Y. Saito, T. Shundo, A. Maeda, H. Kamiya, Y. Uchiyama, M. Fujiwara, F. Aiso, K. Sekine, N. Ohtani
Highly Scalable Metal Induced Lateral Crystallization (MILC) Techniques for Vertical Si Channel in Ultra-High (> 300 Layers) 3D Flash Memory. VLSI Technology and Circuits (2023)
T. Morooka, T. Ishikawa, M. Komura, T. Kato, Y. Koyama, Y. Han, Y. Sugawara, D. Kuwabara, Y. Arayashiki, A. Murayama, K. Nishiyama, K. Sugimae, T. Ogura, H. Takeda, N. Kariya, Y. Goki, S. Konuma, Y. Kamiya, H. Yamashita, H. Shiga, K. Itagaki, R. Tanaka, T. Maeda, N. Ohtani, M. Fujiwara
Optimal Cell Structure/Operation Design of 3D Semicircular Split-gate Cells for Ultra-high-density Flash Memory. VLSI Technology and Circuits (2022)
K. Zaitsu, A. Matsumoto, M. Nishida, Y. Tanaka, H. Yamashita, Y. Satake, T. Watanabe, K. Araki, N. Nei, K. Nakazawa, J. Yamamoto, M. Uehara, H. Kawashima, Y. Kobayashi, T. Hirano, K. Tatani
A 2-Layer Transistor Pixel Stacked CMOS Image Sensor with Oxide-Based Full Trench Isolation for Large Full Well Capacity and High Quantum Efficiency. VLSI Technology and Circuits (2022)
Liangjing Yang, Junchen Wang, Takehiro Ando, A. Kubota, H. Yamashita, Ichiro Sakuma, Toshio Chiba, Etsuko Kobayashi
Vision-based endoscope tracking for 3D ultrasound image-guided surgical navigation. Comput. Medical Imaging Graph. 40 (2015)
Liangjing Yang, Junchen Wang, Etsuko Kobayashi, Hongen Liao, H. Yamashita, Ichiro Sakuma, Toshio Chiba
Ultrasound image-based endoscope localization for minimally invasive fetoscopic surgery. EMBC (2013)
L. Sauter, A. Seekamp, Y. Shibata, Y. Kanameda, H. Yamashita
Whisker mitigation measures for Sn-plated Cu for different stress tests. Microelectron. Reliab. 50 (9-11) (2010)