Whisker mitigation measures for Sn-plated Cu for different stress tests.

L. Sauter A. Seekamp Y. Shibata Y. Kanameda H. Yamashita

Published in: Microelectron. Reliab. (2010)

Keyphrases

real time
statistical tests
data sets
evaluation measures
information retrieval
search engine
multi agent
ground truth
precision and recall
evaluation metrics
evaluation criteria
multiple choice
electron microscopy
complexity measures