Fangzhou Xia

Publication Activity (10 Years)

Years Active: 2017-2023
Publications (10 Years): 10

Top Topics

Atomic Force Microscopy

Controller Design

Top Venues

IEEE Trans. Ind. Electron.

Publications

Jiajie Qiu, Hongjin Kim, Fangzhou Xia, Kamal Youcef-Toumi
Multi-axis Active Vibration Suppression for Wafer Transfer Systems. AIM (2023)
Yip Fun Yeung, Fangzhou Xia, Juliana Covarrubias, Mikio Furokawa, Takayuki Hirano, Kamal Youcef-Toumi
Robotic Method and Instrument to Efficiently Synthesize Faulty Conditions and Mass-Produce Faulty-Conditioned Data for Rotary Machines. ICRA (2023)
Fangzhou Xia, Morgan P. Mayborne, Qiong Ma, Kamal Youcef-Toumi
Physical Intelligence in the Metaverse: Mixed Reality Scale Models for Twistronics and Atomic Force Microscopy. AIM (2022)
Chen Yang, Nicolas Verbeek, Fangzhou Xia, Yi Wang, Kamal Youcef-Toumi
Statically Stable Charge Sensing Method for Precise Displacement Estimation of Piezoelectric Stack-Based Nanopositioning. IEEE Trans. Ind. Electron. 68 (9) (2021)
Chen Yang, Nicolas Verbeek, Fangzhou Xia, Yi Wang, Kamal Youcef-Toumi
Modeling and Control of Piezoelectric Hysteresis: A Polynomial-Based Fractional Order Disturbance Compensation Approach. IEEE Trans. Ind. Electron. 68 (4) (2021)
Chen Yang, Changle Li, Fangzhou Xia, Yanhe Zhu, Jie Zhao, Kamal Youcef-Toumi
Charge Controller With Decoupled and Self-Compensating Configurations for Linear Operation of Piezoelectric Actuators in a Wide Bandwidth. IEEE Trans. Ind. Electron. 66 (7) (2019)
Fangzhou Xia, Chen Yang, Yi Wang, Kamal Youcef-Toumi
Bandwidth Based Repetitive Controller Design for a Modular Multi-actuated AFM Scanner. ACC (2019)
Chen Yang, Fangzhou Xia, Yi Wang, Stephen Truncale, Kamal Youcef-Toumi
Design and Control of a Multi-Actuated Nanopositioning Stage with Stacked Structure. ACC (2019)
Fangzhou Xia, Stephen Truncale, Yi Wang, Kamal Youcef-Toumi
Design and Control of a Multi-actuated High-bandwidth and Large-range Scanner for Atomic Force Microscopy. ACC (2018)
Fangzhou Xia, I. Soltani Bozchalooi, Kamal Youcef-Toumi
Induced vibration contact detection for minimizing cantilever tip-sample interaction forces in jumping mode atomic force microscopy. ACC (2017)