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Design and Control of a Multi-actuated High-bandwidth and Large-range Scanner for Atomic Force Microscopy.

Fangzhou XiaStephen TruncaleYi WangKamal Youcef-Toumi
Published in: ACC (2018)
Keyphrases
  • high bandwidth
  • atomic force microscopy
  • low latency
  • general purpose
  • end to end
  • high density
  • database systems
  • data processing