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Induced vibration contact detection for minimizing cantilever tip-sample interaction forces in jumping mode atomic force microscopy.
Fangzhou Xia
I. Soltani Bozchalooi
Kamal Youcef-Toumi
Published in:
ACC (2017)
Keyphrases
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atomic force microscopy
contact force
human computer interaction
sample size
automatic detection
detection rate
object detection
detection algorithm
data sets
learning algorithm
false positives
false alarms
detection accuracy
detection scheme
anomaly detection
detection method