Eshan Singh

Publication Activity (10 Years)

Years Active: 2011-2023
Publications (10 Years): 11

Top Topics

Error Detection

Industrial Environment

Top Venues

Publications

Minwoo Kang, Azade Nova, Eshan Singh, Geetheeka Sharron Bathini, Yuriy Viktorov
LFPS: Learned Formal Proof Strengthening for Efficient Hardware Verification. ICCAD (2023)
Karthik Ganesan, Florian Lonsing, Srinivasa Shashank Nuthakki, Eshan Singh, Mohammad Rahmani Fadiheh, Wolfgang Kunz, Dominik Stoffel, Clark W. Barrett, Subhasish Mitra
Effective Pre-Silicon Verification of Processor Cores by Breaking the Bounds of Symbolic Quick Error Detection. CoRR (2021)
Eshan Singh, Florian Lonsing, Saranyu Chattopadhyay, Maxwell Strange, Peng Wei, Xiaofan Zhang, Yuan Zhou, Deming Chen, Jason Cong, Priyanka Raina, Zhiru Zhang, Clark W. Barrett, Subhasish Mitra
A-QED Verification of Hardware Accelerators. DAC (2020)
Keerthikumara Devarajegowda, Mohammad Rahmani Fadiheh, Eshan Singh, Clark W. Barrett, Subhasish Mitra, Wolfgang Ecker, Dominik Stoffel, Wolfgang Kunz
QED and Property Generation. DATE (2020)
Eshan Singh, Keerthikumara Devarajegowda, Sebastian Simon, Ralf Schnieder, Karthik Ganesan, Mohammad Rahmani Fadiheh, Dominik Stoffel, Wolfgang Kunz, Clark W. Barrett, Wolfgang Ecker, Subhasish Mitra
Symbolic QED Pre-silicon Verification for Automotive Microcontroller Cores: Industrial Case Study. DATE (2019)
Florian Lonsing, Karthik Ganesan, Makai Mann, Srinivasa Shashank Nuthakki, Eshan Singh, Mario Srouji, Yahan Yang, Subhasish Mitra, Clark W. Barrett
Unlocking the Power of Formal Hardware Verification with CoSA and Symbolic QED: Invited Paper. ICCAD (2019)
Eshan Singh, Keerthikumara Devarajegowda, Sebastian Simon, Ralf Schnieder, Karthik Ganesan, Mohammad Rahmani Fadiheh, Dominik Stoffel, Wolfgang Kunz, Clark W. Barrett, Wolfgang Ecker, Subhasish Mitra
Symbolic QED Pre-silicon Verification for Automotive Microcontroller Cores: Industrial Case Study. CoRR (2019)
Eshan Singh, Clark W. Barrett, Subhasish Mitra
E-QED: Electrical Bug Localization During Post-silicon Validation Enabled by Quick Error Detection and Formal Methods. CAV (2) (2017)
Eshan Singh, David Lin, Clark W. Barrett, Subhasish Mitra
Logic Bug Detection and Localization Using Symbolic Quick Error Detection. CoRR (2017)
Eshan Singh, Clark W. Barrett, Subhasish Mitra
E-QED: Electrical Bug Localization During Post-Silicon Validation Enabled by Quick Error Detection and Formal Methods. CoRR (2017)
Eshan Singh, David Lin, Clark W. Barrett, Subhasish Mitra
Symbolic Quick Error Detection for Pre-Silicon and Post-Silicon Validation: Frequently Asked Questions. IEEE Des. Test 33 (6) (2016)
David Lin, Eshan Singh, Clark W. Barrett, Subhasish Mitra
A structured approach to post-silicon validation and debug using symbolic quick error detection. ITC (2015)
Eshan Singh
Analytical Modeling of 3D Stacked IC Yield from Wafer to Wafer Stacking with Radial Defect Clustering. VLSI Design (2014)
Eshan Singh
Modeling location based wafer die yield variation in estimating 3D stacked IC yield from wafer to wafer stacking. VTS (2014)
Eshan Singh
Impact of Radial defect clustering on 3D stacked IC yield from wafer to wafer stacking. ITC (2012)
Eshan Singh
Exploiting rotational symmetries for improved stacked yields in W2W 3D-SICs. VTS (2011)