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Symbolic Quick Error Detection for Pre-Silicon and Post-Silicon Validation: Frequently Asked Questions.
Eshan Singh
David Lin
Clark W. Barrett
Subhasish Mitra
Published in:
IEEE Des. Test (2016)
Keyphrases
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error detection
high speed
error correction
frequently asked questions
low cost
high density
silicon dioxide
data cleansing
neural network
error correcting
gallium arsenide
error resilient
multimedia
data mining
response time
text mining
error recovery
liquid crystal
artificial intelligence
databases
database