E-QED: Electrical Bug Localization During Post-Silicon Validation Enabled by Quick Error Detection and Formal Methods.
Eshan SinghClark W. BarrettSubhasish MitraPublished in: CoRR (2017)
Keyphrases
- formal methods
- error detection
- bug localization
- error correction
- fault tolerance
- knowledge based systems
- model checking
- source code
- artificial intelligence
- software engineering
- electrical properties
- formal specification
- fault isolation
- fault tolerant
- latent semantic indexing
- development lifecycle
- sensor networks
- formal specification language
- modeling language
- load balancing
- open source
- multimedia