Analytical Modeling of 3D Stacked IC Yield from Wafer to Wafer Stacking with Radial Defect Clustering.
Eshan SinghPublished in: VLSI Design (2014)
Keyphrases
- integrated circuit
- semiconductor manufacturing
- clustering algorithm
- massively parallel
- k means
- clustering method
- cluster analysis
- unsupervised learning
- data clustering
- self organizing maps
- categorical data
- graph theoretic
- hierarchical clustering
- information theoretic
- unsupervised clustering
- combining multiple
- document clustering
- database
- data points
- data streams
- bayesian networks
- case study
- decision trees
- website