A structured approach to post-silicon validation and debug using symbolic quick error detection.
David LinEshan SinghClark W. BarrettSubhasish MitraPublished in: ITC (2015)
Keyphrases
- error detection
- error correction
- error recovery
- data cleansing
- error correcting
- fault tolerance
- error resilient
- structured data
- fault isolation
- high density
- low cost
- fault tolerant
- symbolic representation
- artificial intelligence
- channel coding
- neural network
- response time
- error control
- high level
- field effect transistors