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Daiki Hirabayashi
Publication Activity (10 Years)
Years Active: 2011-2015
Publications (10 Years): 0
Top Topics
Matlab Simulink
Image Sensor
Clock Gating
Duty Cycle
Top Venues
ASP-DAC
APCCAS
VLSIC
J. Electron. Test.
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Publications
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Kiichi Niitsu
,
Yusuke Osawa
,
Naohiro Harigai
,
Daiki Hirabayashi
,
Osamu Kobayashi
,
Takahiro J. Yamaguchi
,
Haruo Kobayashi
A CMOS PWM Transceiver Using Self-Referenced Edge Detection.
IEEE Trans. Very Large Scale Integr. Syst.
23 (6) (2015)
Satoshi Uemori
,
Masamichi Ishii
,
Haruo Kobayashi
,
Daiki Hirabayashi
,
Yuta Arakawa
,
Yuta Doi
,
Osamu Kobayashi
,
Tatsuji Matsuura
,
Kiichi Niitsu
,
Yuji Yano
,
Tatsuhiro Gake
,
Takahiro J. Yamaguchi
,
Nobukazu Takai
Multi-bit Sigma-Delta TDC Architecture with Improved Linearity.
J. Electron. Test.
29 (6) (2013)
Kiichi Niitsu
,
Naohiro Harigai
,
Daiki Hirabayashi
,
Daiki Oki
,
Masato Sakurai
,
Osamu Kobayashi
,
Takahiro J. Yamaguchi
,
Haruo Kobayashi
Design of a clock jitter reduction circuit using gated phase blending between self-delayed clock edges.
ASP-DAC
(2013)
Kiichi Niitsu
,
Masato Sakurai
,
Naohiro Harigai
,
Daiki Hirabayashi
,
Takahiro J. Yamaguchi
,
Haruo Kobayashi
A reference-free on-chip timing jitter measurement circuit using self-referenced clock and a cascaded time difference amplifier in 65nm CMOS.
ASP-DAC
(2012)
Satoshi Uemori
,
Masamichi Ishii
,
Haruo Kobayashi
,
Yuta Doi
,
Osamu Kobayashi
,
Tatsuji Matsuura
,
Kiichi Niitsu
,
Yuta Arakawa
,
Daiki Hirabayashi
,
Yuji Yano
,
Tatsuhiro Gake
,
Nobukazu Takai
,
Takahiro J. Yamaguchi
Multi-bit sigma-delta TDC architecture with self-calibration.
APCCAS
(2012)
Kiichi Niitsu
,
Naohiro Harigai
,
Daiki Hirabayashi
,
Daiki Oki
,
Masato Sakurai
,
Osamu Kobayashi
,
Takahiro J. Yamaguchi
,
Haruo Kobayashi
A clock jitter reduction circuit using gated phase blending between self-delayed clock edges.
VLSIC
(2012)
Masato Sakurai
,
Kiichi Niitsu
,
Naohiro Harigai
,
Daiki Hirabayashi
,
Daiki Oki
,
Takahiro J. Yamaguchi
,
Haruo Kobayashi
Analysis of jitter accumulation in interleaved phase frequency detectors for high-accuracy on-chip jitter measurements.
ISOCC
(2011)