Satoshi Uemori

Publication Activity (10 Years)

Years Active: 2010-2013
Publications (10 Years): 0

Top Topics

Matlab Simulink

High Signal To Noise Ratio

Top Venues

J. Electron. Test.

Publications

Satoshi Uemori, Masamichi Ishii, Haruo Kobayashi, Daiki Hirabayashi, Yuta Arakawa, Yuta Doi, Osamu Kobayashi, Tatsuji Matsuura, Kiichi Niitsu, Yuji Yano, Tatsuhiro Gake, Takahiro J. Yamaguchi, Nobukazu Takai
Multi-bit Sigma-Delta TDC Architecture with Improved Linearity. J. Electron. Test. 29 (6) (2013)
Satoshi Uemori, Masamichi Ishii, Haruo Kobayashi, Yuta Doi, Osamu Kobayashi, Tatsuji Matsuura, Kiichi Niitsu, Yuta Arakawa, Daiki Hirabayashi, Yuji Yano, Tatsuhiro Gake, Nobukazu Takai, Takahiro J. Yamaguchi
Multi-bit sigma-delta TDC architecture with self-calibration. APCCAS (2012)
Takuya Yagi, Kunihiko Usui, Tatsuji Matsuura, Satoshi Uemori, Satoshi Ito, Yohei Tan, Haruo Kobayashi
Background Self-Calibration Algorithm for Pipelined ADC Using Split ADC Scheme. IEICE Trans. Electron. (7) (2011)
Tomohiko Ogawa, Haruo Kobayashi, Satoshi Uemori, Yohei Tan, Satoshi Ito, Nobukazu Takai, Takahiro J. Yamaguchi, Kiichi Niitsu
Design for Testability That Reduces Linearity Testing Time of SAR ADCs. IEICE Trans. Electron. (6) (2011)
Tomohiko Ogawa, Haruo Kobayashi, Yohei Tan, Satoshi Ito, Satoshi Uemori, Nobukazu Takai, Kiichi Niitsu, Takahiro J. Yamaguchi, Tatsuji Matsuura, Nobuyoshi Ishikawa
SAR ADC that is configurable to optimize yield. APCCAS (2010)
Takuya Yagi, Kunihiko Usui, Tatsuji Matsuura, Satoshi Uemori, Yohei Tan, Satoshi Ito, Haruo Kobayashi
Background calibration algorithm for pipelined ADC with open-loop residue amplifier using split ADC structure. APCCAS (2010)
Satoshi Uemori, Takahiro J. Yamaguchi, Satoshi Ito, Yohei Tan, Haruo Kobayashi, Nobukazu Takai, Kiichi Niitsu, Nobuyoshi Ishikawa
ADC linearity test signal generation algorithm. APCCAS (2010)
Satoshi Ito, Shigeyuki Nishimura, Haruo Kobayashi, Satoshi Uemori, Yohei Tan, Nobukazu Takai, Takahiro J. Yamaguchi, Kiichi Niitsu
Stochastic TDC architecture with self-calibration. APCCAS (2010)