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ADC linearity test signal generation algorithm.

Satoshi UemoriTakahiro J. YamaguchiSatoshi ItoYohei TanHaruo KobayashiNobukazu TakaiKiichi NiitsuNobuyoshi Ishikawa
Published in: APCCAS (2010)
Keyphrases
  • generation algorithm
  • test data generation
  • high frequency
  • signal processing
  • non stationary
  • database
  • real time
  • databases
  • data mining
  • information retrieval
  • information systems
  • compressive sensing