Diagnosis of Single Gate Delay Faults in Combinational Circuits using Delay Fault Simulation.
Hiroshi TakahashiKwame Osei BoatengYuzo TakamatsuPublished in: Asian Test Symposium (1998)
Keyphrases
- fault diagnosis
- fault detection
- multiple faults
- fault models
- fault model
- fault detection and diagnosis
- model based diagnosis
- analog circuits
- fault identification
- fault detection and isolation
- neural network
- power dissipation
- discrete event
- fault isolation
- industrial processes
- repair actions
- fault management
- logic synthesis
- multiple input
- asynchronous circuits
- fault localization
- medical diagnosis