Kwame Osei Boateng

Publication Activity (10 Years)

Years Active: 1997-2020
Publications (10 Years): 4

Top Topics

Developing Countries

Top Venues

ICCSA (Short Papers/poster papers/PhD student showcase works)

Peer-to-Peer Netw. Appl.

IET Wirel. Sens. Syst.

Int. J. Commun. Syst.

Publications

Henry Nunoo-Mensah, Kwame Osei Boateng, James Dzisi Gadze
PSTRM: Privacy-aware sociopsychological trust and reputation model for wireless sensor networks. Peer-to-Peer Netw. Appl. 13 (5) (2020)
Henry Nunoo-Mensah, Kwame Osei Boateng, James D. Gadze
The adoption of socio- and bio-inspired algorithms for trust models in wireless sensor networks: A survey. Int. J. Commun. Syst. 31 (7) (2018)
Henry Nunoo-Mensah, Kwame Osei Boateng, James D. Gadze
Tamper-aware authentication framework for wireless sensor networks. IET Wirel. Sens. Syst. 7 (3) (2017)
Julius Quarshie Azasoo, Kwame Osei Boateng
A Retrofit Design Science Methodology for Smart Metering Design in Developing Countries. ICCSA (Short Papers/poster papers/PhD student showcase works) (2015)
Takahisa Hiraide, Kwame Osei Boateng, Hideaki Konishi, Koichi Itaya, Michiaki Emori, Hitoshi Yamanaka, Takashi Mochiyama
BIST-Aided Scan Test - A New Method for Test Cost Reduction. VTS (2003)
Hiroshi Takahashi, Kwame Osei Boateng, Kewal K. Saluja, Yuzo Takamatsu
On diagnosing multiple stuck-at faults using multiple and singlefault simulation in combinational circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 21 (3) (2002)
Kwame Osei Boateng, Hideaki Konishi, Tsuneo Nakata
A Method of Static Compaction of Test Stimuli. Asian Test Symposium (2001)
Kwame Osei Boateng, Hiroshi Takahashi, Yuzo Takamatsu
General BIST-Amenable Method of Test Generation for Iterative Logic Arrays. VTS (2000)
Hiroshi Takahashi, Kwame Osei Boateng, Yuzo Takamatsu
A New Method for Diagnosing Multiple Stuck-at Faults using Multiple and Single Fault Simulations. VTS (1999)
Hiroshi Takahashi, Kwame Osei Boateng, Yuzo Takamatsu, Nobuhiro Yanagida
Multiple Fault Diagnosis in Logic Circuits Using EB Tester and Multiple/Single Fault Simulators. Asian Test Symposium (1999)
Hiroshi Takahashi, Kwame Osei Boateng, Yuzo Takamatsu
Diagnosis of Single Gate Delay Faults in Combinational Circuits using Delay Fault Simulation. Asian Test Symposium (1998)
Kwame Osei Boateng, Hiroshi Takahashi, Yuzo Takamatsu
Design of C-Testable Multipliers Based on the Modified Booth Algorithm. Asian Test Symposium (1997)
Hiroshi Takahashi, Kwame Osei Boateng, Yuzo Takamatsu, Toshiyuki Matsunaga
A Method of Generating Tests for Marginal Delays an Delay Faults in Combinational Circuits. Asian Test Symposium (1997)