A New Method for Diagnosing Multiple Stuck-at Faults using Multiple and Single Fault Simulations.
Hiroshi TakahashiKwame Osei BoatengYuzo TakamatsuPublished in: VTS (1999)
Keyphrases
- detection method
- experimental evaluation
- fault diagnosis
- computational complexity
- support vector machine svm
- model selection
- dynamic programming
- high accuracy
- genetic algorithm
- fault detection
- high precision
- computational cost
- preprocessing
- probabilistic model
- significant improvement
- artificial neural networks
- optimization algorithm
- detection algorithm
- objective function
- similarity measure
- simulation model
- neural network