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Multiple Fault Diagnosis in Logic Circuits Using EB Tester and Multiple/Single Fault Simulators.

Hiroshi TakahashiKwame Osei BoatengYuzo TakamatsuNobuhiro Yanagida
Published in: Asian Test Symposium (1999)
Keyphrases
  • fault diagnosis
  • expert systems
  • neural network
  • fuzzy logic
  • fault detection
  • real time
  • artificial intelligence
  • computational intelligence
  • power transformers