Takashi Mochiyama

Publication Activity (10 Years)

Years Active: 2003-2004
Publications (10 Years): 0

Publications

Daisuke Maruyama, Akira Kanuma, Takashi Mochiyama, Hiroaki Komatsu, Yaroku Sugiyama, Noriyuki Ito
Detection of multiple transitions in delay fault test of SPARC64 microprocessor. ICCAD (2004)
Takahisa Hiraide, Kwame Osei Boateng, Hideaki Konishi, Koichi Itaya, Michiaki Emori, Hitoshi Yamanaka, Takashi Mochiyama
BIST-Aided Scan Test - A New Method for Test Cost Reduction. VTS (2003)