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Noriyuki Ito
Publication Activity (10 Years)
Years Active: 1990-2009
Publications (10 Years): 0
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Publications
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Wanping Zhang
,
Wenjian Yu
,
Xiang Hu
,
Ling Zhang
,
Rui Shi
,
He Peng
,
Zhi Zhu
,
Lew Chua-Eoan
,
Rajeev Murgai
,
Toshiyuki Shibuya
,
Noriyuki Ito
,
Chung-Kuan Cheng
Efficient Power Network Analysis Considering Multidomain Clock Gating.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
28 (9) (2009)
Wanping Zhang
,
Ling Zhang
,
Rui Shi
,
He Peng
,
Zhi Zhu
,
Lew Chua-Eoan
,
Rajeev Murgai
,
Toshiyuki Shibuya
,
Noriyuki Ito
,
Chung-Kuan Cheng
Fast power network analysis with multiple clock domains.
ICCD
(2007)
Noriyuki Ito
,
Hiroaki Komatsu
,
Akira Kanuma
,
Akihiro Yoshitake
,
Yoshiyasu Tanamura
,
Hiroyuki Sugiyama
,
Ryoichi Yamashita
,
Ken-ichi Nabeya
,
Hironobu Yoshino
,
Hitoshi Yamanaka
,
Masahiro Yanagida
,
Yoshitomo Ozeki
,
Kinya Ishizaka
,
Takeshi Kono
,
Yutaka Isoda
Design Methodology for 2.4GHz Dual-Core Microprocessor.
ASP-DAC
(2007)
Noriyuki Ito
,
Hideaki Katagiri
,
Ryoichi Yamashita
,
Hiroshi Ikeda
,
Hiroyuki Sugiyama
,
Hiroaki Komatsu
,
Yoshiyasu Tanamura
,
Akihiro Yoshitake
,
Kazuhiro Nonomura
,
Kinya Ishizaka
,
Hiroaki Adachi
,
Yutaka Mori
,
Yutaka Isoda
,
Yaroku Sugiyama
Diagonal routing in high performance microprocessor design.
ASP-DAC
(2006)
Noriyuki Ito
,
Akira Kanuma
,
Daisuke Maruyama
,
Hitoshi Yamanaka
,
Tsuyoshi Mochizuki
,
Osamu Sugawara
,
Chihiro Endoh
,
Masahiro Yanagida
,
Takeshi Kono
,
Yutaka Isoda
,
Kazunobu Adachi
,
Takahisa Hiraide
,
Shigeru Nagasawa
,
Yaroku Sugiyama
,
Eizo Ninoi
Delay defect screening for a 2.16GHz SPARC64 microprocessor.
ASP-DAC
(2006)
Daisuke Maruyama
,
Akira Kanuma
,
Takashi Mochiyama
,
Hiroaki Komatsu
,
Yaroku Sugiyama
,
Noriyuki Ito
Detection of multiple transitions in delay fault test of SPARC64 microprocessor.
ICCAD
(2004)
Noriyuki Ito
,
Hiroaki Komatsu
,
Yoshiyasu Tanamura
,
Ryoichi Yamashita
,
Hiroyuki Sugiyama
,
Yaroku Sugiyama
,
Hirofumi Hamamura
A Physical Design Methodology for 1.3GHz SPARC64 Microprocessor.
ICCD
(2003)
Noriyuki Ito
Automatic Incorporation of On-Chip Testability Circuits.
DAC
(1990)