Hideaki Konishi

Publication Activity (10 Years)

Years Active: 2001-2008
Publications (10 Years): 0

Publications

Masayuki Arai, Satoshi Fukumoto, Kazuhiko Iwasaki, Tatsuru Matsuo, Takahisa Hiraide, Hideaki Konishi, Michiaki Emori, Takashi Aikyo
Test Data Compression for Scan-Based BIST Aiming at 100x Compression Rate. IEICE Trans. Inf. Syst. (3) (2008)
Masayuki Arai, Satoshi Fukumoto, Kazuhiko Iwasaki, Tatsuru Matsuo, Takahisa Hiraide, Hideaki Konishi, Michiaki Emori, Takashi Aikyo
Test Data Compression of 100x for Scan-Based BIST. ITC (2006)
Hideaki Konishi, Michiaki Emori, Takahisa Hiraide
The Application of BIST-Aided Scan Test for Real Chips. ATS (2006)
Takahisa Hiraide, Kwame Osei Boateng, Hideaki Konishi, Koichi Itaya, Michiaki Emori, Hitoshi Yamanaka, Takashi Mochiyama
BIST-Aided Scan Test - A New Method for Test Cost Reduction. VTS (2003)
Kwame Osei Boateng, Hideaki Konishi, Tsuneo Nakata
A Method of Static Compaction of Test Stimuli. Asian Test Symposium (2001)