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Hideaki Konishi
Publication Activity (10 Years)
Years Active: 2001-2008
Publications (10 Years): 0
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Publications
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Masayuki Arai
,
Satoshi Fukumoto
,
Kazuhiko Iwasaki
,
Tatsuru Matsuo
,
Takahisa Hiraide
,
Hideaki Konishi
,
Michiaki Emori
,
Takashi Aikyo
Test Data Compression for Scan-Based BIST Aiming at 100x Compression Rate.
IEICE Trans. Inf. Syst.
(3) (2008)
Masayuki Arai
,
Satoshi Fukumoto
,
Kazuhiko Iwasaki
,
Tatsuru Matsuo
,
Takahisa Hiraide
,
Hideaki Konishi
,
Michiaki Emori
,
Takashi Aikyo
Test Data Compression of 100x for Scan-Based BIST.
ITC
(2006)
Hideaki Konishi
,
Michiaki Emori
,
Takahisa Hiraide
The Application of BIST-Aided Scan Test for Real Chips.
ATS
(2006)
Takahisa Hiraide
,
Kwame Osei Boateng
,
Hideaki Konishi
,
Koichi Itaya
,
Michiaki Emori
,
Hitoshi Yamanaka
,
Takashi Mochiyama
BIST-Aided Scan Test - A New Method for Test Cost Reduction.
VTS
(2003)
Kwame Osei Boateng
,
Hideaki Konishi
,
Tsuneo Nakata
A Method of Static Compaction of Test Stimuli.
Asian Test Symposium
(2001)