Login / Signup

Test Data Compression for Scan-Based BIST Aiming at 100x Compression Rate.

Masayuki AraiSatoshi FukumotoKazuhiko IwasakiTatsuru MatsuoTakahisa HiraideHideaki KonishiMichiaki EmoriTakashi Aikyo
Published in: IEICE Trans. Inf. Syst. (2008)
Keyphrases