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Test Data Compression of 100x for Scan-Based BIST.

Masayuki AraiSatoshi FukumotoKazuhiko IwasakiTatsuru MatsuoTakahisa HiraideHideaki KonishiMichiaki EmoriTakashi Aikyo
Published in: ITC (2006)
Keyphrases
  • test data
  • test cases
  • training data
  • test set
  • image compression
  • data sets
  • training set
  • search based testing
  • image processing
  • feature extraction