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BIST-Aided Scan Test - A New Method for Test Cost Reduction.

Takahisa HiraideKwame Osei BoatengHideaki KonishiKoichi ItayaMichiaki EmoriHitoshi YamanakaTakashi Mochiyama
Published in: VTS (2003)
Keyphrases
  • test data
  • objective function
  • cost function
  • learning algorithm
  • probabilistic model
  • multi class
  • graphical models
  • combinatorial optimization
  • statistical significance
  • cost reduction