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On diagnosing multiple stuck-at faults using multiple and singlefault simulation in combinational circuits.
Hiroshi Takahashi
Kwame Osei Boateng
Kewal K. Saluja
Yuzo Takamatsu
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2002)
Keyphrases
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data sets
real world
website
case study
high speed
fault detection