A Method of Generating Tests for Marginal Delays an Delay Faults in Combinational Circuits.
Hiroshi TakahashiKwame Osei BoatengYuzo TakamatsuToshiyuki MatsunagaPublished in: Asian Test Symposium (1997)
Keyphrases
- experimental evaluation
- clustering method
- significant improvement
- high accuracy
- fully automatic
- pairwise
- synthetic data
- cost function
- computational cost
- high precision
- test data
- classification method
- detection method
- prior knowledge
- preprocessing
- objective function
- support vector machine
- data sets
- multiresolution
- feature selection