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Reliability-Enhancement and Self-Repair Schemes for SRAMs With Static and Dynamic Faults.
Jin-Fu Li
Tsu-Wei Tseng
Chih-Sheng Hou
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (2010)
Keyphrases
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error detection
repair actions
failure rate
fault diagnosis
fault isolation
image processing
image enhancement
reliability analysis
multiple faults
test cases
fault detection
consistent query answering
cold standby
real time
reliability assessment
image analysis
optimal solution
information retrieval