Test Generation for Delay Faults on Clock Lines under Launch-on-Capture Test Environment.
Yoshinobu HigamiHiroshi TakahashiShin-ya KobayashiKewal K. SalujaPublished in: IEICE Trans. Inf. Syst. (2013)
Keyphrases
- test generation
- test cases
- mutation testing
- test sequences
- software testing
- design automation
- static analysis
- test suite
- code coverage
- symbolic execution
- test data generation
- mobile robot
- regression testing
- quality assurance
- fault detection
- fault diagnosis
- real world
- high speed
- image data
- neural network
- data sets
- object oriented
- multi agent systems
- high level
- decision trees
- artificial intelligence