Superior reliability and reduced Time-Dependent variability in high-mobility SiGe channel pMOSFETs for VLSI logic applications.
Jacopo FrancoBen KaczerJérôme MitardMaria Toledano-LuqueFelice CrupiGeert EnemanPh. J. RousseTibor GrasserM. ChoThomas KaueraufLiesbeth WittersGeert HellingsL.-Å. RagnarssonNaoto HoriguchiMarc M. HeynsGuido GroesenekenPublished in: ICICDT (2012)