Logic circuit testing for transient faults.
Smita KrishnaswamyIgor L. MarkovJohn P. HayesPublished in: ETS (2005)
Keyphrases
- test cases
- digital circuits
- delay insensitive
- logic synthesis
- model based diagnosis
- logic circuits
- fault diagnosis
- asynchronous circuits
- classical logic
- fault model
- defeasible logic
- analog circuits
- chip design
- steady state
- built in self test
- high speed
- proof theory
- truth table
- micron cmos
- software testing
- fault detection
- modal logic
- logic programming
- root cause
- multi valued
- analog vlsi
- flip flops
- test data
- test generation
- test suite
- multiple faults
- neural network