Diagnosis of clustered faults and wafer testing.
Kaiyuan HuangVinod K. AgarwalKrishnaiyan ThulasiramanPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1998)
Keyphrases
- fault model
- fault diagnosis
- model based diagnosis
- fault detection
- multiple faults
- fault detection and diagnosis
- test cases
- fault models
- fault identification
- model based reasoning
- fault detection and isolation
- root cause
- expert systems
- neural network
- integrated circuit
- medical diagnosis
- semiconductor manufacturing
- fault isolation
- diagnostic reasoning
- industrial processes
- genetic algorithm
- breast cancer diagnosis
- hierarchical structure