On Test Generation for Iddq Testing of Bridging Faults in CMOS Circuits.
S. Wayne BollingerScott F. MidkiffPublished in: ITC (1991)
Keyphrases
- reverse engineering
- test generation
- test cases
- mutation testing
- delay insensitive
- object oriented
- high speed
- analog vlsi
- symbolic execution
- test sequences
- circuit design
- software testing
- software engineering
- design automation
- vlsi circuits
- quality assurance
- test data generation
- cmos technology
- random access memory
- static analysis
- code coverage
- regression testing
- floating gate
- fault diagnosis
- test suite
- testing process
- correlation analysis
- test set
- fault models
- chip design
- power consumption
- low cost
- focal plane
- mixed signal
- asynchronous circuits
- power dissipation
- image processing
- low power
- data model