Defect identification on specular machined surfaces.
Ken SillsGary M. BoneDavid W. CapsonPublished in: Mach. Vis. Appl. (2014)
Keyphrases
- surface roughness
- curved surfaces
- three dimensional
- photometric properties
- specular highlights
- light source
- surface reconstruction
- specular reflection
- free form
- surface shape
- surface properties
- reflectance properties
- manufacturing process
- surface reflectance
- defect detection
- specular surfaces
- reflectance model
- real objects
- surface patches
- d objects