REFLECTANCE MODEL
Experts
- Edwin R. Hancock
- Paul E. Debevec
- Katsushi Ikeuchi
- Boxin Shi
- Abhijeet Ghosh
- Pieter Peers
- Yasuyuki Matsushita
- Ko Nishino
- Imari Sato
- Philip L. Worthington
- Shree K. Nayar
- Michael Breuß
- Tommy W. S. Chow
- Osamu Ikeda
- Qinhuo Liu
- Jonathan T. Barron
- Graham Fyffe
- Daisuke Miyazaki
- William A. P. Smith
- Yue Dong
- Siu-Yeung Cho
- Daniel Cremers
- Yvain Quéau
- Kalyan Sunkavalli
- Roberto Mecca
- Konstantinos Rematas
- Alfred M. Bruckstein
- Philippe Bekaert
- Yoichi Sato
- Yixin Zhang
- Jun Sato
- Zhuo Hui
- Jean-Denis Durou
- Hossein Ragheb
- Aswin C. Sankaranarayanan
- Fumihiko Sakaue
- Ron Kimmel
- Michael S. Langer
- Lawrence B. Wolff
Venues
- CoRR
- CVPR
- IEEE Trans. Pattern Anal. Mach. Intell.
- Remote. Sens.
- ICCV
- ACM Trans. Graph.
- IGARSS
- IEEE Trans. Geosci. Remote. Sens.
- Comput. Graph. Forum
- BMVC
- IEEE Trans. Image Process.
- ICIP
- Int. J. Comput. Vis.
- MVA
- 3DV
- Comput. Vis. Image Underst.
- Image Vis. Comput.
- ICPR
- Color Imaging: Displaying, Processing, Hardcopy, and Applications
- Systems and Computers in Japan
- SIGGRAPH Posters
- CIC
- Sensors
- AAAI
- SIGGRAPH Talks
- CGIV/MCS
- IEEE Access
- Pattern Recognit. Lett.
- Int. J. Appl. Earth Obs. Geoinformation
- Rendering Techniques
- IEEE Computer Graphics and Applications
- ICCP
- DAGM-Symposium
- Color Imaging Conference
- Mach. Vis. Appl.
- IEEE Trans. Vis. Comput. Graph.
- ECCV (2)
- SIGGRAPH
- EUSIPCO
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