REFLECTANCE MODEL
Experts
- Edwin R. Hancock
- Paul E. Debevec
- Katsushi Ikeuchi
- Boxin Shi
- Abhijeet Ghosh
- Pieter Peers
- Imari Sato
- Yasuyuki Matsushita
- Ko Nishino
- Philip L. Worthington
- Shree K. Nayar
- Michael Breuß
- Daisuke Miyazaki
- Graham Fyffe
- William A. P. Smith
- Qinhuo Liu
- Yue Dong
- Tommy W. S. Chow
- Siu-Yeung Cho
- Osamu Ikeda
- Jonathan T. Barron
- Daniel Cremers
- Zhuo Hui
- Xin Tong
- Yixin Zhang
- Qian Zheng
- Lawrence B. Wolff
- Satoshi Ikehata
- Jean-Denis Durou
- Yoichi Sato
- Aly A. Farag
- Hossein Ragheb
- Alfred M. Bruckstein
- Ping Tan
- Fumihiko Sakaue
- Kalyan Sunkavalli
- Michael S. Langer
- Yvain Quéau
- Shinsaku Hiura
Venues
- CoRR
- CVPR
- IEEE Trans. Pattern Anal. Mach. Intell.
- Remote. Sens.
- ACM Trans. Graph.
- ICCV
- IGARSS
- IEEE Trans. Geosci. Remote. Sens.
- Comput. Graph. Forum
- IEEE Trans. Image Process.
- BMVC
- ICIP
- Int. J. Comput. Vis.
- MVA
- 3DV
- Systems and Computers in Japan
- ICPR
- Image Vis. Comput.
- Color Imaging: Displaying, Processing, Hardcopy, and Applications
- Comput. Vis. Image Underst.
- CIC
- SIGGRAPH Posters
- AAAI
- Sensors
- Pattern Recognit. Lett.
- ICCP
- CGIV/MCS
- IEEE Access
- Int. J. Appl. Earth Obs. Geoinformation
- DAGM-Symposium
- IEEE Computer Graphics and Applications
- Rendering Techniques
- SIGGRAPH Talks
- ECCV (2)
- IROS
- IJCAI
- Multim. Tools Appl.
- VISIGRAPP (4: VISAPP)
- Measuring, Modeling, and Reproducing Material Appearance
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