REFLECTANCE MODEL
Experts
- Edwin R. Hancock
- Katsushi Ikeuchi
- Paul E. Debevec
- Boxin Shi
- Abhijeet Ghosh
- Pieter Peers
- Yasuyuki Matsushita
- Imari Sato
- Ko Nishino
- Philip L. Worthington
- Shree K. Nayar
- Michael Breuß
- Qinhuo Liu
- William A. P. Smith
- Graham Fyffe
- Daisuke Miyazaki
- Osamu Ikeda
- Daniel Cremers
- Jonathan T. Barron
- Siu-Yeung Cho
- Tommy W. S. Chow
- Yue Dong
- Jean-Denis Durou
- Satoshi Ikehata
- Hossein Ragheb
- Aly A. Farag
- Yoichi Sato
- Lawrence B. Wolff
- Yixin Zhang
- Qian Zheng
- Xin Tong
- Zhuo Hui
- Aswin C. Sankaranarayanan
- Ravi Ramamoorthi
- Jun Sato
- Roberto Mecca
- Konstantinos Rematas
- Brian V. Funt
- Ron Kimmel
Venues
- CoRR
- CVPR
- IEEE Trans. Pattern Anal. Mach. Intell.
- Remote. Sens.
- ICCV
- ACM Trans. Graph.
- IGARSS
- IEEE Trans. Geosci. Remote. Sens.
- Comput. Graph. Forum
- BMVC
- IEEE Trans. Image Process.
- ICIP
- MVA
- Int. J. Comput. Vis.
- 3DV
- Color Imaging: Displaying, Processing, Hardcopy, and Applications
- Image Vis. Comput.
- ICPR
- Comput. Vis. Image Underst.
- Systems and Computers in Japan
- Sensors
- AAAI
- SIGGRAPH Posters
- CIC
- IEEE Computer Graphics and Applications
- DAGM-Symposium
- Int. J. Appl. Earth Obs. Geoinformation
- SIGGRAPH Talks
- Rendering Techniques
- IEEE Access
- Pattern Recognit. Lett.
- ICCP
- CGIV/MCS
- Multim. Tools Appl.
- EUSIPCO
- Mach. Vis. Appl.
- ECCV (1)
- CAIP
- VISAPP (2)
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