SURFACE ROUGHNESS
Experts
- Paul A. Hwang
- Panagiotis D. Christofides
- Kun-Shan Chen
- Michael H. Cosh
- Jesús Álvarez-Mozos
- Niko E. C. Verhoest
- Mahta Moghaddam
- Katsushi Ikeuchi
- Dara Entekhabi
- Mehrez Zribi
- Jiancheng Shi
- Joseph C. Chen
- Leung Tsang
- Mark A. Bourassa
- Andrés Bustillo
- Azlan Mohd Zain
- Shree K. Nayar
- Bertrand Chapron
- Yisok Oh
- Safian Sharif
- Habibollah Haron
- Ruzbeh Akbar
- Nicolas N. Baghdadi
- Edwin R. Hancock
- Shunlin Liang
- Yiming Lou
- Abhijeet Ghosh
- Francesco Mattia
- David E. Weissman
- Paul E. Debevec
- Hossein Ragheb
- Bijan Davvaz
- Sivaprasad Gogineni
- Sang-Eun Park
- Takayuki Okatani
- Jeffrey P. Walker
- Hans Lievens
- Jan-Peter Muller
- Vinod Yadava
Venues
- IGARSS
- IEEE Trans. Geosci. Remote. Sens.
- Sensors
- Remote. Sens.
- CoRR
- Int. J. Autom. Technol.
- IEEE Access
- ICRA
- IEEE Geosci. Remote. Sens. Lett.
- IEEE Trans. Instrum. Meas.
- J. Intell. Manuf.
- IEEE J. Sel. Top. Appl. Earth Obs. Remote. Sens.
- Int. J. Manuf. Res.
- IROS
- Expert Syst. Appl.
- Prod. Eng.
- CVPR
- Int. J. Comput. Integr. Manuf.
- Int. J. Manuf. Technol. Manag.
- Comput. Aided Des.
- Neural Comput. Appl.
- SIAM J. Math. Anal.
- IGARSS (2)
- Comput. Graph. Forum
- IEEE Trans. Vis. Comput. Graph.
- I2MTC
- EMBC
- Symmetry
- CDC
- Inf. Sci.
- IEICE Trans. Electron.
- Appl. Math. Comput.
- NEMS
- EMEIT
- Comput. Geosci.
- Simul. Model. Pract. Theory
- MVA
- Microelectron. J.
- Int. J. Comput. Appl. Technol.
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