SURFACE PROPERTIES
Experts
- Jan Vrsek
- Niels Lubbes
- Katsushi Ikeuchi
- Luiz Velho
- Thomas W. Sederberg
- Kristin J. Dana
- Luc Van Gool
- Dahua Lin
- Helmut Pottmann
- Xinzhu Ma
- Reinhard Klein
- Shree K. Nayar
- Seungmoon Choi
- Wanli Ouyang
- Fuhua Cheng
- Bert Jüttler
- Takashi Maekawa
- Caiming Zhang
- James Hays
- Ko Nishino
- Patsorn Sangkloy
- Chen Fang
- Matteo Gallet
- Ron Kimmel
- Peter J. Giblin
- Jörn Ostermann
- Alan L. Yuille
- Tobias Ritschel
- Zhe Wang
- Michael M. Bronstein
- Fisher Yu
- Josef Schicho
- Jingwan Lu
- Penny Rheingans
- Miroslav Lávicka
- Hans-Peter Seidel
- Tomislav Pribanic
- Xiaohu Guo
- Jeff Erickson
Venues
- CoRR
- CVPR
- Comput. Aided Geom. Des.
- Sensors
- Comput. Aided Des.
- ICRA
- IGARSS
- ICCV
- ACM Trans. Graph.
- IEEE Trans. Geosci. Remote. Sens.
- Remote. Sens.
- IEEE Trans. Pattern Anal. Mach. Intell.
- Vis. Comput.
- IEEE Access
- IROS
- Image Vis. Comput.
- NeurIPS
- ICIP
- Comput. Graph. Forum
- IEEE Trans. Vis. Comput. Graph.
- Comput. Graph.
- Appl. Math. Comput.
- IEEE Robotics Autom. Lett.
- MVA
- ICPR
- Mach. Vis. Appl.
- IEEE Geosci. Remote. Sens. Lett.
- IEEE Computer Graphics and Applications
- Pattern Recognit.
- Multim. Tools Appl.
- SIGGRAPH Posters
- Neurocomputing
- Comput. Vis. Image Underst.
- Displays
- Int. J. Bifurc. Chaos
- IEEE Visualization
- ICPR (1)
- J. Comput. Appl. Math.
- IEEE Signal Process. Lett.
Related Topics
Related Keywords
Popularity
No popularities found. Try to change the filters.
Popularity Trend