SURFACE PROPERTIES
Experts
- Jan Vrsek
- Katsushi Ikeuchi
- Kristin J. Dana
- Niels Lubbes
- Luc Van Gool
- Luiz Velho
- Thomas W. Sederberg
- Reinhard Klein
- Fuhua Cheng
- Dahua Lin
- Wanli Ouyang
- Seungmoon Choi
- Helmut Pottmann
- Xinzhu Ma
- Shree K. Nayar
- Jingwan Lu
- Fisher Yu
- Jörn Ostermann
- Xiaohu Guo
- Ko Nishino
- Alan L. Yuille
- Peter J. Giblin
- Shoji Tominaga
- Josef Schicho
- Caiming Zhang
- Edwin R. Hancock
- Takashi Maekawa
- Hans-Peter Seidel
- Tomislav Pribanic
- Tobias Ritschel
- Jeff Erickson
- Ron Kimmel
- Patsorn Sangkloy
- Matteo Gallet
- Chen Fang
- Michael M. Bronstein
- Bert Jüttler
- Penny Rheingans
- Miroslav Lávicka
Venues
- CoRR
- CVPR
- Comput. Aided Geom. Des.
- Comput. Aided Des.
- Sensors
- IGARSS
- ACM Trans. Graph.
- ICRA
- ICCV
- Remote. Sens.
- IEEE Trans. Geosci. Remote. Sens.
- IROS
- IEEE Trans. Pattern Anal. Mach. Intell.
- IEEE Access
- Vis. Comput.
- NeurIPS
- Image Vis. Comput.
- ICIP
- Comput. Graph.
- Comput. Graph. Forum
- IEEE Trans. Vis. Comput. Graph.
- Appl. Math. Comput.
- MVA
- IEEE Robotics Autom. Lett.
- ICPR
- IEEE Computer Graphics and Applications
- Multim. Tools Appl.
- Mach. Vis. Appl.
- Pattern Recognit.
- SIGGRAPH Posters
- IEEE Geosci. Remote. Sens. Lett.
- Neurocomputing
- ICPR (1)
- IEEE Visualization
- Displays
- Symmetry
- Comput. Vis. Image Underst.
- CVPR Workshops
- MMCS
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