SURFACE REFLECTANCE
Experts
- Katsushi Ikeuchi
- Edwin R. Hancock
- Boxin Shi
- Yasuyuki Matsushita
- Ko Nishino
- Paul E. Debevec
- Roberto Mecca
- Imari Sato
- Ravi Ramamoorthi
- Norimichi Tsumura
- Todd E. Zickler
- Shunlin Liang
- Pieter Peers
- Aly A. Farag
- Roberto Cipolla
- Mark S. Drew
- Yvain Quéau
- Melvyn L. Smith
- Eric F. Vermote
- Yoichi Sato
- Ruigang Yang
- Michael Breuß
- Shree K. Nayar
- Maria Petrou
- Yoichi Miyake
- Brian V. Funt
- Luc Van Gool
- Takahiro Okabe
- Hossein Ragheb
- Graham D. Finlayson
- Alfred M. Bruckstein
- William A. P. Smith
- Philip L. Worthington
- Koichiro Deguchi
- David J. Kriegman
- Yuji Iwahori
- Daisuke Miyazaki
- Jean-Denis Durou
- Ryszard Kozera
Venues
- CoRR
- CVPR
- Remote. Sens.
- IGARSS
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICCV
- IEEE Trans. Geosci. Remote. Sens.
- ICIP
- ACM Trans. Graph.
- Sensors
- Color Imaging Conference
- Int. J. Comput. Vis.
- BMVC
- MVA
- Comput. Vis. Image Underst.
- 3DV
- IEEE Trans. Image Process.
- CIC
- IEEE Access
- Comput. Graph. Forum
- CGIV
- EMBC
- Pattern Recognit. Lett.
- ICRA
- Systems and Computers in Japan
- ICCP
- ICPR
- Mach. Vis. Appl.
- J. Electronic Imaging
- CVPR (1)
- Color Imaging: Displaying, Processing, Hardcopy, and Applications
- ECCV (2)
- Color Imaging: Processing, Hardcopy, and Applications
- IEEE Geosci. Remote. Sens. Lett.
- Image Vis. Comput.
- SIGGRAPH Posters
- Rendering Techniques
- IEEE Trans. Instrum. Meas.
- Int. J. Appl. Earth Obs. Geoinformation
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