PHOTOMETRIC PROPERTIES
Experts
- Kristin J. Dana
- Edwin R. Hancock
- Jan J. Koenderink
- Naoki Asada
- Renjie Liao
- Abhinav Gupta
- Xiaojuan Qi
- Fuxin Li
- Zhengzhe Liu
- Rahul Sawhney
- Jiaya Jia
- Shree K. Nayar
- Paul E. Debevec
- Yizhou Yu
- Raquel Urtasun
- Henrik I. Christensen
- Hyun Soo Park
- Rong Lu
- Won Hwa Kim
- Marcel Radermacher
- David F. Fouhey
- Robert Muhr
- Jitendra Malik
- Minsu Cho
- Xiaolong Wang
- Géza Tóth
- A. Aydin Alatan
- Stefano Mattoccia
- Joshua M. Susskind
- Luigi Di Stefano
- Martial Hebert
- Miguel Ángel Bautista
- Khiem Vuong
- Helmut Pottmann
- Ramesh Raskar
- Ken Sills
- Ali Dabouei
- Peter Wassum
- Jun Gao
Venues
- CoRR
- CVPR
- ICCV
- ICRA
- Comput. Aided Geom. Des.
- Comput. Graph. Forum
- IEEE Trans. Pattern Anal. Mach. Intell.
- ACM Trans. Graph.
- Vis. Comput.
- WACV
- Discret. Comput. Geom.
- ICIP
- IEEE Trans. Vis. Comput. Graph.
- Sensors
- 3DV
- Graph. Model.
- IEEE Trans. Image Process.
- Rendering Techniques
- Pattern Recognit. Lett.
- Int. J. Comput. Vis.
- J. Math. Imaging Vis.
- IEEE Access
- SIGGRAPH Posters
- Comput. Aided Des.
- CVPR Workshops
- Image Vis. Comput.
- ICLR
- Comput. Vis. Image Underst.
- IMR
- J. Symb. Comput.
- IGARSS
- ROBIO
- ICPR (1)
- Ars Comb.
- CRV
- SCG
- ISVC (1)
- Graphs Comb.
- Discret. Math.
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