PHOTOMETRIC PROPERTIES
Experts
- Kristin J. Dana
- Naoki Asada
- Jan J. Koenderink
- Edwin R. Hancock
- Raquel Urtasun
- Renjie Liao
- Xiaojuan Qi
- Abhinav Gupta
- Fuxin Li
- Jiaya Jia
- Rahul Sawhney
- Yizhou Yu
- Paul E. Debevec
- Shree K. Nayar
- Henrik I. Christensen
- Zhengzhe Liu
- Monique Teillaud
- Pavel Valtr
- Heung-Yeung Shum
- Jean-Marc Schlenker
- Astrid M. L. Kappers
- Marcel Radermacher
- Ravi Ramamoorthi
- Zhanglin Peng
- Fabio Tosi
- Pierluigi Zama Ramirez
- Won Hwa Kim
- Bolei Zhou
- Stergios I. Roumeliotis
- Yuke Zhu
- Zhipeng Bao
- Kangxue Yin
- Ruimao Zhang
- Jia-Wei Liu
- Tianyuan Yang
- Liang Lin
- Rong Lu
- Bert Jüttler
- Jing Wang
Venues
- CoRR
- CVPR
- ICCV
- Comput. Aided Geom. Des.
- ICRA
- IEEE Trans. Pattern Anal. Mach. Intell.
- Comput. Graph. Forum
- ACM Trans. Graph.
- WACV
- Discret. Comput. Geom.
- IEEE Trans. Vis. Comput. Graph.
- ICIP
- Vis. Comput.
- Comput. Vis. Image Underst.
- ICLR
- 3DV
- Image Vis. Comput.
- Int. J. Comput. Vis.
- IEEE Access
- Graph. Model.
- Comput. Aided Des.
- SIGGRAPH Posters
- IEEE Trans. Image Process.
- CVPR Workshops
- J. Math. Imaging Vis.
- Sensors
- Rendering Techniques
- Pattern Recognit. Lett.
- ISVC (1)
- Pattern Recognit.
- Ars Comb.
- Remote. Sens.
- IMR
- BMVC
- Discret. Math.
- IEEE Trans. Geosci. Remote. Sens.
- SIGGRAPH
- CRV
- ICPR (1)
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