Functional test generation for path delay faults.
Mandyam-Komar SrinivasVishwani D. AgrawalMichael L. BushnellPublished in: Asian Test Symposium (1995)
Keyphrases
- test generation
- test cases
- mutation testing
- test sequences
- symbolic execution
- design automation
- quality assurance
- destination node
- test data generation
- fault diagnosis
- software testing
- static analysis
- regression testing
- path length
- fault detection
- shortest path
- data sets
- test set
- multiple paths
- case study
- complex systems
- image data
- multi agent systems
- code coverage