Advanced embedded memory testing: Reducing the defect per million level at lower test cost.
Said HamdiouiAd J. van de GoorPublished in: DDECS (2010)
Keyphrases
- testing process
- test cases
- storage overhead
- test generation
- software testing
- statistical tests
- test case generation
- test data
- test sequences
- set of test cases
- number of test cases
- regression testing
- memory usage
- high cost
- internal memory
- integration testing
- code coverage
- memory space
- test data generation
- test suite
- test set
- model based testing
- high quality
- neural network