A test generation system for path delay faults.
Srinivas PatilSudhakar M. ReddyPublished in: ICCD (1989)
Keyphrases
- test generation
- test cases
- mutation testing
- test sequences
- symbolic execution
- static analysis
- design automation
- software testing
- shortest path
- test set
- test data generation
- fault diagnosis
- destination node
- fault detection
- quality assurance
- image processing
- test suite
- data sets
- artificial intelligence
- path length
- matching algorithm
- database applications
- error rate
- regression testing
- xml data
- open source
- high level