SMART and FAST: Test Generation for VLSI Scan-Design Circuits.

Miron Abramovici James J. Kulikowski Premachandran R. Menon David T. Miller

Published in: IEEE Des. Test (1986)

Keyphrases

test generation
design automation
chip design
circuit design
test cases
power dissipation
high speed
design process
case study
software testing
single chip
mutation testing
database
vlsi circuits
digital circuits
test sequences
software systems
building blocks
object oriented
database systems
databases