David T. Miller

Publication Activity (10 Years)

Years Active: 1983-1992
Publications (10 Years): 0

Publications

Miron Abramovici, Krishna B. Rajan, David T. Miller
Freeze!: A New Approach for Testing Sequential Circuits. DAC (1992)
Miron Abramovici, David T. Miller, Rabindra K. Roy
Dynamic redundancy identification in automatic test generation. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 11 (3) (1992)
Miron Abramovici, David T. Miller, R. Henning
Global cost functions for test generation. ITC (1990)
Miron Abramovici, David T. Miller, Rabindra K. Roy
Dynamic redundancy identification in automatic test generation. ICCAD (1989)
Miron Abramovici, James J. Kulikowski, David T. Miller, Prem R. Menon
System-level design verification in the AT&T Computer Division: tools. ICCD (1989)
Miron Abramovici, J. W. Bierbauer, R. H. Hellman, C. L. Hong, David T. Miller, R. G. Taylor
System-level design verification in the AT&T computer division: overview and strategy. ICCD (1989)
Miron Abramovici, Prem R. Menon, David T. Miller
Checkpoint Faults are not Sufficient Target Faults for Test Generation. IEEE Trans. Computers 35 (8) (1986)
Miron Abramovici, James J. Kulikowski, Premachandran R. Menon, David T. Miller
SMART and FAST: Test Generation for VLSI Scan-Design Circuits. IEEE Des. Test 3 (4) (1986)
Miron Abramovici, James J. Kulikowski, Premachandran R. Menon, David T. Miller
Test Generation In Lamp2: Concepts and Algorithms. ITC (1985)
Miron Abramovici, James J. Kulikowski, Premachandran R. Menon, David T. Miller
Test Generation In Lamp2: System Overview. ITC (1985)
Miron Abramovici, Prem R. Menon, David T. Miller
Critical Path Tracing: An Alternative to Fault Simulation. IEEE Des. Test 1 (1) (1984)
Miron Abramovici, Prem R. Menon, David T. Miller
Critical path tracing - an alternative to fault simulation. DAC (1983)