James J. Kulikowski

Publication Activity (10 Years)

Years Active: 1985-1991
Publications (10 Years): 0

Publications

Miron Abramovici, James J. Kulikowski, Rabindra K. Roy
The Best Flip-Flops to Scan. ITC (1991)
Miron Abramovici, James J. Kulikowski, David T. Miller, Prem R. Menon
System-level design verification in the AT&T Computer Division: tools. ICCD (1989)
Miron Abramovici, James J. Kulikowski, Premachandran R. Menon, David T. Miller
SMART and FAST: Test Generation for VLSI Scan-Design Circuits. IEEE Des. Test 3 (4) (1986)
Miron Abramovici, James J. Kulikowski, Premachandran R. Menon, David T. Miller
Test Generation In Lamp2: Concepts and Algorithms. ITC (1985)
Miron Abramovici, James J. Kulikowski, Premachandran R. Menon, David T. Miller
Test Generation In Lamp2: System Overview. ITC (1985)