Fault simulation of parametric bridging faults in CMOS IC's.
Marcello DalpassoMichele FavalliPiero OlivoBruno RiccòPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1993)
Keyphrases
- fault diagnosis
- fault detection
- multiple faults
- fault model
- fault detection and isolation
- low cost
- simulation study
- expert systems
- fault detection and diagnosis
- condition monitoring
- simulation environment
- integrated circuit
- simulation model
- high speed
- fuzzy logic
- simulation models
- error detection
- power supply
- power consumption
- industrial processes
- mathematical model
- chip design
- data sets
- repair actions