Stuck Fault and Current Testing Comparison Using CMOS Chip Test.

Thomas M. Storey Wojciech Maly John Andrews Myron Miske

Published in: ITC (1991)

Keyphrases

high speed
test cases
analog vlsi
test data
low cost
test generation
circuit design
regression testing
statistical tests
software testing
cmos image sensor
testing process
power consumption
test sequences
fault diagnosis
test data generation
low voltage
low power
power dissipation
fault model
neural network
real time